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| 期刊詳細資料 Journal detailed information |
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| 作者(Author) | Chen*, Yu-Shan, Chun-Yu Shih, and Ching-Hsun Chang |
| 篇名(Article title) | Explore the new relationship between patents and market value: A panel smooth transition regression (PSTR) approach |
| 期刊名(Journal name) | Scientometrics |
| 國際期刊(International Journal) | SSCI |
| 中文摘要(Abstrct) | |
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| 卷期(Volume No) | Vol.98 No.2 |
| 頁數(Page number) | PP.1145~1159 |
| 年份(Year) | 2014 |
| 語言(Language) | 2 |
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