期刊詳細資料 Journal detailed information  
作者(Author)Chen*, Yu-Shan , and Ke-Chiun Chang
篇名(Article title)Using the entropy-based patent measure to explore the influences of related and unrelated technological diversification upon technological competences and firm performance
期刊名(Journal name)Scientometrics
國際期刊(International Journal)SSCI
中文摘要(Abstrct)
ABSTRCT
中文關鍵字(Keyword)
KEYWORD
卷期(Volume No)Vol. 90 No. 3
頁數(Page number)pp. 825~841
年份(Year)2012
語言(Language)英文 English