| 期刊詳細資料 Journal detailed information | |
| 作者(Author) | Chen*, Yu-Shan , and Ke-Chiun Chang |
| 篇名(Article title) | Using the entropy-based patent measure to explore the influences of related and unrelated technological diversification upon technological competences and firm performance |
| 期刊名(Journal name) | Scientometrics |
| 國際期刊(International Journal) | SSCI |
| 中文摘要(Abstrct) | |
| ABSTRCT | |
| 中文關鍵字(Keyword) | |
| KEYWORD | |
| 卷期(Volume No) | Vol. 90 No. 3 |
| 頁數(Page number) | pp. 825~841 |
| 年份(Year) | 2012 |
| 語言(Language) | 英文 English |