| 期刊詳細資料 Journal detailed information | |
| 作者(Author) | Lee, C. W.*, T. K. Yeh, G. S. Peng |
| 篇名(Article title) | Traceability in metrology and uncertainty evaluation of a calibration system for GPS receivers |
| 期刊名(Journal name) | Proceedings of SPIE - The International Society for Optical Engineering |
| 國際期刊(International Journal) | EI |
| 中文摘要(Abstrct) | |
| ABSTRCT | |
| 中文關鍵字(Keyword) | |
| KEYWORD | |
| 卷期(Volume No) | Vol. 5190 |
| 頁數(Page number) | pp. 410~418 |
| 年份(Year) | 2003 |
| 語言(Language) | 英文 English |